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45 weitere Werte:
- schottky barriers 2 Treffer
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- wide band gap semiconductors 2 Treffer
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- buffer layers 1 Treffer
- cathodes 1 Treffer
- coefficient of thermal expansion (cte) 1 Treffer
- conductivity 1 Treffer
- current collapse 1 Treffer
- current density 1 Treffer
- cutoff frequency 1 Treffer
- direct-coupled fet logic (dcfl) 1 Treffer
- double-channel 1 Treffer
- driver circuits 1 Treffer
- electrons 1 Treffer
- enhancement mode (e-mode) 1 Treffer
- fet integrated circuits 1 Treffer
- finfet 1 Treffer
- finfets 1 Treffer
- flip-chip (fc) 1 Treffer
- fluoride-based plasma treatment 1 Treffer
- heterostructure 1 Treffer
- high electron mobility transistor (hemt) 1 Treffer
- high voltage 1 Treffer
- high-electron mobility transistors (hemts) 1 Treffer
- high-temperature electronics 1 Treffer
- ic 1 Treffer
- iii-v semiconductor materials 1 Treffer
- ingan 1 Treffer
- inverters 1 Treffer
- laser sintering 1 Treffer
- light emitting diodes 1 Treffer
- light-emitting diode (led) 1 Treffer
- logic circuits 1 Treffer
- low turn-on voltage 1 Treffer
- metal-insulator structures 1 Treffer
- metal-insulator-semiconductor high-electron-mobility transistor (mis-hemt) 1 Treffer
- normally off 1 Treffer
- packaging 1 Treffer
- plasma measurements 1 Treffer
- power generation 1 Treffer
- recessed anode 1 Treffer
- schottky barrier diode (sbd) 1 Treffer
Inhaltsanbieter
8 Treffer
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In: IEEE Electron Device Letters, Jg. 27 (2006-10-01), Heft 10, S. 793-795Online academicJournalZugriff:
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In: IEEE Electron Device Letters, Jg. 39 (2018-02-01), Heft 2, S. 260-260Online academicJournalZugriff:
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In: IEEE Electron Device Letters, Jg. 34 (2013-11-01), Heft 11, S. 1373-1375Online academicJournalZugriff:
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In: IEEE Electron Device Letters, Jg. 28 (2007-05-01), Heft 5, S. 328-331Online academicJournalZugriff:
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In: IEEE Electron Device Letters, Jg. 32 (2011-11-01), Heft 11, S. 1519-1521Online academicJournalZugriff:
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In: IEEE Electron Device Letters, Jg. 31 (2010-05-01), Heft 5, S. 455-457Online academicJournalZugriff:
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In: IEEE Electron Device Letters, Jg. 36 (2015-10-01), Heft 10, S. 1008-1008Online academicJournalZugriff:
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In: IEEE Electron Device Letters, Jg. 35 (2014-07-01), Heft 7, S. 735-735Online academicJournalZugriff: