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Weniger Treffer
Art der Quelle
Thema
- components, circuits, devices and systems 19 Treffer
- engineered materials, dielectrics and plasmas 18 Treffer
- fields, waves and electromagnetics 16 Treffer
- power, energy and industry applications 15 Treffer
- robotics and control systems 15 Treffer
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45 weitere Werte:
- signal processing and analysis 15 Treffer
- communication, networking and broadcast technologies 13 Treffer
- computing and processing 13 Treffer
- bioengineering 12 Treffer
- engineering profession 12 Treffer
- photonics and electrooptics 11 Treffer
- aerospace 9 Treffer
- geoscience 9 Treffer
- nuclear engineering 9 Treffer
- transportation 9 Treffer
- temperature 7 Treffer
- stress 6 Treffer
- capacitance-voltage characteristics 4 Treffer
- current measurement 4 Treffer
- degradation 4 Treffer
- failure analysis 4 Treffer
- frequency measurement 4 Treffer
- laboratories 4 Treffer
- leakage current 4 Treffer
- life estimation 4 Treffer
- acceleration 3 Treffer
- capacitors 3 Treffer
- coils 3 Treffer
- dielectric breakdown 3 Treffer
- electric breakdown 3 Treffer
- protection 3 Treffer
- random access memory 3 Treffer
- thyristors 3 Treffer
- aluminum 2 Treffer
- anodes 2 Treffer
- capacitance 2 Treffer
- cathodes 2 Treffer
- circuits 2 Treffer
- cmos process 2 Treffer
- concrete 2 Treffer
- costs 2 Treffer
- dielectric materials 2 Treffer
- dielectric measurements 2 Treffer
- diodes 2 Treffer
- frequency 2 Treffer
- gold 2 Treffer
- insulation 2 Treffer
- local oscillators 2 Treffer
- noise figure 2 Treffer
- performance evaluation 2 Treffer
Verlag
Publikation
- 2005 ieee international reliability physics symposium, 2005. proceedings. 43rd annual., reliability physics symposium, 2005. proceedings. 43rd annual. 2005 ieee international, reliability physics 7 Treffer
- proceedings of the ieee, proc. ieee 5 Treffer
- proceedings of the ire, proc. ire 3 Treffer
- 17th international reliability physics symposium, reliability physics symposium, 1979. 17th annual 2 Treffer
- 2005 ieee international integrated reliability workshop, integrated reliability workshop final report, 2005 ieee international, integrated reliability workshop 2 Treffer
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17 weitere Werte:
- 1993 ieee instrumentation and measurement technology conference, instrumentation and measurement technology conference, 1993. imtc/93. conference record., ieee, instrumentation and measurement technology 1 Treffer
- 2006 ieee international integrated reliability workshop final report, integrated reliability workshop final report, 2006 ieee international 1 Treffer
- 2008 ieee international reliability physics symposium, reliability physics symposium, 2008. irps 2008. ieee international 1 Treffer
- 2018 ieee conference of russian young researchers in electrical and electronic engineering (eiconrus), young researchers in electrical and electronic engineering (eiconrus), 2018 ieee conference of russian 1 Treffer
- 2022 13th international conference on live maintenance (icolim), live maintenance (icolim), 2022 13th international conference on 1 Treffer
- 2022 2nd international conference on advance computing and innovative technologies in engineering (icacite), advance computing and innovative technologies in engineering (icacite), 2022 2nd international conference on 1 Treffer
- 27th annual proceedings., international reliability physics symposium, reliability physics symposium, 1989. 27th annual proceedings., international 1 Treffer
- 28th annual proceedings on reliability physics symposium, reliability physics symposium, 1990. 28th annual proceedings., international 1 Treffer
- 6th ieee conference record., instrumentation and measurement technology conference, instrumentation and measurement technology conference, 1989. imtc-89. conference record., 6th ieee 1 Treffer
- fourth annual symposium on the physics of failure in electronics, physics of failure in electronics, 1965. fourth annual symposium on the 1 Treffer
- ieee transactions on power electronics, power electronics, ieee transactions on, ieee trans. power electron. 1 Treffer
- melecon '98. 9th mediterranean electrotechnical conference. proceedings (cat. no.98ch36056), electrotechnical conference, 1998. melecon 98., 9th mediterranean, melecon '98 1 Treffer
- pcic europe 2010, pcic europe 2010 conference record 1 Treffer
- proceedings of the 10th international symposium on the physical and failure analysis of integrated circuits. ipfa 2003, physical and failure analysis of integrated circuits, 2003. ipfa 2003. proceedings of the 10th international symposium on the, physical and failure analysis of integrated circuits 1 Treffer
- proceedings of the 1997 6th international symposium on the physical and failure analysis of integrated circuits, physical & failure analysis of integrated circuits, 1997., proceedings of the 1997 6th international symposium on, physical and failure analysis of integrated circuits 1 Treffer
- proceedings of the institute of radio engineers, radio engineers, proceedings of the institute of, proc. inst. radio eng. 1 Treffer
- twenty-first international conference on thermoelectrics, 2002. proceedings ict '02., thermoelectrics, 2002. proceedings ict '02. twenty-first international conference on, thermoelectrics 1 Treffer
Inhaltsanbieter
36 Treffer
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In: 17th International Reliability Physics Symposium, 1979-04-01, S. 30Online KonferenzZugriff:
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In: 17th International Reliability Physics Symposium, 1979-04-01, S. 156Online KonferenzZugriff:
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In: 2022 13th International Conference on Live Maintenance (ICOLIM), 2022-06-15, S. 1-5Online KonferenzZugriff:
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In: 2022 2nd International Conference on Advance Computing and Innovative Technologies in Engineering (ICACITE), 2022-04-28, S. 1701-1704Online KonferenzZugriff:
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In: 2018 IEEE Conference of Russian Young Researchers in Electrical and Electronic Engineering (EIConRus), 2018, S. 1702-1705Online KonferenzZugriff:
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In: Proceedings of the IRE, Proc. IRE, Jg. 39 (1951-06-01), Heft 6, S. 680-684Online academicJournalZugriff:
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In: PCIC Europe 2010, 2010-06-01, S. 1-7Online KonferenzZugriff:
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In: Proceedings of the IRE, Proc. IRE, Jg. 38 (1950-07-01), Heft 7, S. 774-776Online academicJournalZugriff:
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In: 2005 IEEE International Reliability Physics Symposium, 2005. Proceedings. 43rd, 2005, S. 431-434Online KonferenzZugriff:
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In: 2005 IEEE International Reliability Physics Symposium, 2005. Proceedings. 43rd, 2005, S. 474-477Online KonferenzZugriff:
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In: 2005 IEEE International Reliability Physics Symposium, 2005. Proceedings. 43rd, 2005, S. 495-500Online KonferenzZugriff:
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In: Proceedings of the 10th International Symposium on the Physical and Failure Analysis of Integrated Circuits. IPFA 2003, 2003, S. 183-186Online KonferenzZugriff:
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In: MELECON '98. 9th Mediterranean Electrotechnical Conference. Proceedings (Cat. No.98CH36056), Jg. 2 (1998), S. 978-982Online KonferenzZugriff:
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In: Proceedings of the 1997 6th International Symposium on the Physical and Failure Analysis of Integrated Circuits, 1997, S. 152-155Online KonferenzZugriff:
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In: Twenty-First International Conference on Thermoelectrics, 2002. Proceedings ICT, 2002, S. 170-172Online KonferenzZugriff:
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In: 1993 IEEE Instrumentation and Measurement Technology Conference, 1993, S. 171-176Online KonferenzZugriff:
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In: 2008 IEEE International Reliability Physics Symposium, 2008-04-01, S. 172Online KonferenzZugriff:
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In: 28th Annual Proceedings on Reliability Physics Symposium, 1990, S. 170-177KonferenzZugriff:
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In: 2006 IEEE International Integrated Reliability Workshop Final Report, 2006-10-01, S. 171Online KonferenzZugriff:
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In: 2005 IEEE International Reliability Physics Symposium, 2005. Proceedings. 43rd, 2005, S. 612-613Online KonferenzZugriff: