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- <formula formulatype="inline"><tex notation="tex">$\hbox{hfo}_{2}$ </tex></formula> 1 Treffer
- <formula formulatype="inline"><tex notation="tex">$\hbox{laalo}_{3}$</tex></formula> 1 Treffer
- <italic xmlns:ali="http://www.niso.org/schemas/ali/1.0/" xmlns:mml="http://www.w3.org/1998/math/mathml" xmlns:xlink="http://www.w3.org/1999/xlink" xmlns:xsi="http://www.w3.org/2001/xmlschema-instance">p</italic>-channel 1 Treffer
- 2-deg 1 Treffer
- annealing 1 Treffer
- apertures 1 Treffer
- atomic layer deposition 1 Treffer
- buffer layers 1 Treffer
- cmos 1 Treffer
- current aperture vertical electron transistor (cavet) 1 Treffer
- current collapse 1 Treffer
- current measurement 1 Treffer
- cvd 1 Treffer
- dispersion 1 Treffer
- double heterojunction (dh) 1 Treffer
- driver circuits 1 Treffer
- dynamic on-resistance 1 Treffer
- electron devices 1 Treffer
- electron velocity 1 Treffer
- energy efficiency 1 Treffer
- enhancement-mode (e-mode) 1 Treffer
Inhaltsanbieter
23 Treffer
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In: IEEE Electron Device Letters, Jg. 44 (2023-05-01), Heft 5, S. 841-844Online academicJournalZugriff:
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In: IEEE Electron Device Letters, Jg. 44 (2023-08-01), Heft 8, S. 1332-1335Online academicJournalZugriff:
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In: IEEE Electron Device Letters, Jg. 43 (2022-04-01), Heft 4, S. 545-548Online academicJournalZugriff:
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In: IEEE Electron Device Letters, Jg. 34 (2013-02-01), Heft 2, S. 199-201Online academicJournalZugriff:
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In: IEEE Electron Device Letters, Jg. 41 (2020-08-01), Heft 8, S. 1173-1176Online academicJournalZugriff:
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In: IEEE Electron Device Letters, Jg. 41 (2020-05-01), Heft 5, S. 689-692Online academicJournalZugriff:
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In: IEEE Electron Device Letters, Jg. 40 (2019-11-01), Heft 11, S. 1736-1739Online academicJournalZugriff:
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In: IEEE Electron Device Letters, Jg. 39 (2018-11-01), Heft 11, S. 1720-1720Online academicJournalZugriff:
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In: IEEE Electron Device Letters, Jg. 35 (2014-02-01), Heft 2, S. 175-177Online academicJournalZugriff:
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In: IEEE Electron Device Letters, Jg. 34 (2013-11-01), Heft 11, S. 1373-1375Online academicJournalZugriff:
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In: IEEE Electron Device Letters, Jg. 34 (2013-09-01), Heft 9, S. 1118-1120Online academicJournalZugriff:
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In: IEEE Electron Device Letters, Jg. 38 (2017-12-01), Heft 12, S. 1704-1704Online academicJournalZugriff:
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In: IEEE Electron Device Letters, Jg. 38 (2017-12-01), Heft 12, S. 1708-1708Online academicJournalZugriff:
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In: IEEE Electron Device Letters, Jg. 33 (2012), Heft 1, S. 35-37Online academicJournalZugriff:
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In: IEEE Electron Device Letters, Jg. 33 (2012), Heft 1, S. 38-40Online academicJournalZugriff:
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In: IEEE Electron Device Letters, Jg. 38 (2017-03-01), Heft 3, S. 367-367Online academicJournalZugriff:
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In: IEEE Electron Device Letters, Jg. 32 (2011-11-01), Heft 11, S. 1519-1521Online academicJournalZugriff:
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In: IEEE Electron Device Letters, Jg. 32 (2011-09-01), Heft 9, S. 1215-1217Online academicJournalZugriff:
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In: IEEE Electron Device Letters, Jg. 32 (2011-08-01), Heft 8, S. 1074-1076Online academicJournalZugriff:
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In: IEEE Electron Device Letters, Jg. 32 (2011-05-01), Heft 5, S. 635-637Online academicJournalZugriff: