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Weniger Treffer
Art der Quelle
Thema
- communication, networking and broadcast technologies 39 Treffer
- aerospace 35 Treffer
- bioengineering 34 Treffer
- degradation 22 Treffer
- mosfet 22 Treffer
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45 weitere Werte:
- engineered materials, dielectrics and plasmas 21 Treffer
- robotics and control systems 18 Treffer
- signal processing and analysis 17 Treffer
- computing and processing 12 Treffer
- fields, waves and electromagnetics 12 Treffer
- reliability 12 Treffer
- threshold voltage 11 Treffer
- dielectrics 10 Treffer
- silicon carbide 10 Treffer
- temperature measurement 10 Treffer
- negative bias temperature instability 8 Treffer
- photonics and electrooptics 8 Treffer
- silicon 8 Treffer
- switches 8 Treffer
- tddb 8 Treffer
- transportation 8 Treffer
- aluminum gallium nitride 6 Treffer
- electric breakdown 6 Treffer
- gallium nitride 6 Treffer
- hemts 6 Treffer
- leakage currents 6 Treffer
- thermal variables control 6 Treffer
- charge carrier processes 5 Treffer
- electron traps 5 Treffer
- resistance 5 Treffer
- stress measurement 5 Treffer
- transistors 5 Treffer
- bti 4 Treffer
- electric fields 4 Treffer
- electrostatic discharges 4 Treffer
- finfets 4 Treffer
- gan 4 Treffer
- general topics for engineers 4 Treffer
- insulated gate bipolar transistors 4 Treffer
- integrated circuit modeling 4 Treffer
- modfets 4 Treffer
- mos devices 4 Treffer
- performance evaluation 4 Treffer
- capacitors 3 Treffer
- current measurement 3 Treffer
- engineering profession 3 Treffer
- failure analysis 3 Treffer
- field effect transistors 3 Treffer
- hot carriers 3 Treffer
- human computer interaction 3 Treffer
Verlag
Publikation
- 2016 ieee international reliability physics symposium (irps), reliability physics symposium (irps), 2016 ieee international 28 Treffer
- 2018 ieee 30th international symposium on power semiconductor devices and ics (ispsd), power semiconductor devices and ics (ispsd), 2018 ieee 30th international symposium on 8 Treffer
- ieee transactions on device and materials reliability, device and materials reliability, ieee transactions on, ieee trans. device mater. relib. 6 Treffer
- 2010 ieee international integrated reliability workshop final report, integrated reliability workshop final report (irw), 2010 ieee international 5 Treffer
- 2015 17th european conference on power electronics and applications (epe'15 ecce-europe), power electronics and applications (epe'15 ecce-europe), 2015 17th european conference on 3 Treffer
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28 weitere Werte:
- 2011 international conference on quality, reliability, risk, maintenance, and safety engineering, quality, reliability, risk, maintenance, and safety engineering (icqr2mse), 2011 international conference on 2 Treffer
- 2011 12th intl. conf. on thermal, mechanical & multi-physics simulation and experiments in microelectronics and microsystems, thermal, mechanical and multi-physics simulation and experiments in microelectronics and microsystems (eurosime), 2011 12th international conference on 1 Treffer
- 2011 ieee 23rd international symposium on power semiconductor devices and ics, power semiconductor devices and ics (ispsd), 2011 ieee 23rd international symposium on 1 Treffer
- 2011 second international conference on mechanic automation and control engineering, mechanic automation and control engineering (mace), 2011 second international conference on 1 Treffer
- 2012 17th ieee european test symposium (ets), test symposium (ets), 2012 17th ieee european 1 Treffer
- 2012 19th ieee international symposium on the physical and failure analysis of integrated circuits, physical and failure analysis of integrated circuits (ipfa), 2012 19th ieee international symposium on the 1 Treffer
- 2012 ieee compound semiconductor integrated circuit symposium (csics), compound semiconductor integrated circuit symposium (csics), 2012 ieee 1 Treffer
- 2013 ieee international reliability physics symposium (irps), reliability physics symposium (irps), 2013 ieee international 1 Treffer
- 2013 international conference on simulation of semiconductor processes and devices (sispad), simulation of semiconductor processes and devices (sispad), 2013 international conference on 1 Treffer
- 2014 10th international conference on reliability, maintainability and safety (icrms), reliability, maintainability and safety (icrms), 2014 international conference on 1 Treffer
- 2014 26th international conference on microelectronics (icm), microelectronics (icm), 2014 26th international conference on 1 Treffer
- 2014 44th european solid state device research conference (essderc), solid state device research conference (essderc), 2014 44th european 1 Treffer
- 2014 ieee international electric vehicle conference (ievc), electric vehicle conference (ievc), 2014 ieee international 1 Treffer
- 2014 ieee international integrated reliability workshop final report (iirw), integrated reliability workshop final report (iirw), 2014 ieee international 1 Treffer
- 2015 annual ieee india conference (indicon), india conference (indicon), 2015 annual ieee 1 Treffer
- 2015 international conference on electronics packaging and imaps all asia conference (icep-iaac), electronics packaging and imaps all asia conference (icep-iacc), 2015 international conference on 1 Treffer
- 2015 international conference on man and machine interfacing (mami), man and machine interfacing (mami), 2015 international conference on 1 Treffer
- 2015 symposium on vlsi circuits (vlsi circuits), vlsi circuits (vlsi circuits), 2015 symposium on 1 Treffer
- 2016 7th india international conference on power electronics (iicpe), power electronics (iicpe), 2016 7th india international conference on 1 Treffer
- 2016 ieee 4th workshop on wide bandgap power devices and applications (wipda), wide bandgap power devices and applications (wipda), 2016 ieee 4th workshop on 1 Treffer
- 2016 ieee international conference on power electronics, drives and energy systems (pedes), power electronics, drives and energy systems (pedes), 2016 ieee international conference on 1 Treffer
- 2017 ieee 17th international conference on nanotechnology (ieee-nano), nanotechnology (ieee-nano), 2017 ieee 17th international conference on 1 Treffer
- 2018 20th european conference on power electronics and applications (epe'18 ecce europe), power electronics and applications (epe'18 ecce europe), 2018 20th european conference on 1 Treffer
- 2018 ieee international conference on manipulation, manufacturing and measurement on the nanoscale (3m-nano), manipulation, manufacturing and measurement on the nanoscale (3m-nano), 2018 ieee international conference on 1 Treffer
- 2019 ieee 7th workshop on wide bandgap power devices and applications (wipda), wide bandgap power devices and applications (wipda), 2019 ieee 7th workshop on 1 Treffer
- 2020 17th china international forum on solid state lighting & 2020 international forum on wide bandgap semiconductors china (sslchina: ifws), solid state lighting & 2020 international forum on wide bandgap semiconductors china (sslchina: ifws), 2020 17th china international forum on 1 Treffer
- 2020 china semiconductor technology international conference (cstic), semiconductor technology international conference (cstic), 2020 china 1 Treffer
- 2022 17th conference on ph.d research in microelectronics and electronics (prime), ph.d research in microelectronics and electronics (prime), 2022 17th conference on 1 Treffer
Inhaltsanbieter
79 Treffer
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In: 2022 17th Conference on Ph.D Research in Microelectronics and Electronics (PRIME), 2022-06-12, S. 21-24Online KonferenzZugriff:
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In: 2020 17th China International Forum on Solid State Lighting & 2020 International Forum on Wide Bandgap Semiconductors China (SSLChina: IFWS), 2020-11-23, S. 238-241Online KonferenzZugriff:
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In: 2017 IEEE 17th International Conference on Nanotechnology (IEEE-NANO), 2017-07-01, S. 459-462Online KonferenzZugriff:
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In: 2015 17th European Conference on Power Electronics and Applications (EPE'15 ECCE-Europe), 2015-09-01, S. 1-10Online KonferenzZugriff:
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In: 2015 17th European Conference on Power Electronics and Applications (EPE'15 ECCE-Europe), 2015-09-01, S. 1-9Online KonferenzZugriff:
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In: 2015 17th European Conference on Power Electronics and Applications (EPE'15 ECCE-Europe), 2015-09-01, S. 1-9Online KonferenzZugriff:
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In: 2012 17th IEEE European Test Symposium (ETS), 2012-05-01, S. 1-6Online KonferenzZugriff:
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In: IEEE Transactions on Device and Materials Reliability, Jg. 24 (2024-06-01), Heft 2, S. 174-183Online academicJournalZugriff:
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In: 2010 IEEE International Integrated Reliability Workshop Final Report, 2010-10-01, S. 17-21Online KonferenzZugriff:
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In: 2016 IEEE International Reliability Physics Symposium (IRPS), 2016-04-01, S. 1Online KonferenzZugriff:
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In: 2020 China Semiconductor Technology International Conference (CSTIC), 2020-06-26, S. 1-5Online KonferenzZugriff:
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In: 2019 IEEE 7th Workshop on Wide Bandgap Power Devices and Applications (WiPDA), 2019-10-01, S. 177-180Online KonferenzZugriff:
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In: 2018 IEEE International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale (3M-NANO), 2018-08-01, S. 237-240Online KonferenzZugriff:
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In: 2018 IEEE 30th International Symposium on Power Semiconductor Devices and ICs (ISPSD), 2018-05-01, S. 40-43Online KonferenzZugriff:
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In: 2018 IEEE 30th International Symposium on Power Semiconductor Devices and ICs (ISPSD), 2018-05-01, S. 24-27Online KonferenzZugriff:
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In: 2018 IEEE 30th International Symposium on Power Semiconductor Devices and ICs (ISPSD), 2018-05-01, S. 299-302Online KonferenzZugriff:
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In: 2018 IEEE 30th International Symposium on Power Semiconductor Devices and ICs (ISPSD), 2018-05-01, S. 303-306Online KonferenzZugriff:
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In: 2018 IEEE 30th International Symposium on Power Semiconductor Devices and ICs (ISPSD), 2018-05-01, S. 315-318Online KonferenzZugriff:
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In: 2018 IEEE 30th International Symposium on Power Semiconductor Devices and ICs (ISPSD), 2018-05-01, S. 363-366Online KonferenzZugriff:
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In: 2018 IEEE 30th International Symposium on Power Semiconductor Devices and ICs (ISPSD), 2018-05-01, S. 383-386Online KonferenzZugriff: