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- Entferne Filter: Thema: components, circuits, devices and systems
- Entferne Filter: Publikation: ieee transactions on very large scale integration (vlsi) systems, very large scale integration (vlsi) systems, ieee transactions on, ieee trans. vlsi syst.
- Entferne Filter: Thema: runtime
- Entferne Filter: Thema: reliability
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- bandwidth 1 Treffer
- bandwidth usage 1 Treffer
- cache memory 1 Treffer
- codecs 1 Treffer
- cognition 1 Treffer
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14 weitere Werte:
- crosstalk 1 Treffer
- degradation 1 Treffer
- error correction 1 Treffer
- error tolerance 1 Treffer
- hardware 1 Treffer
- hardware/software co-design 1 Treffer
- integrated circuit reliability 1 Treffer
- memory architecture 1 Treffer
- microprocessors 1 Treffer
- power demand 1 Treffer
- redundancy 1 Treffer
- robustness 1 Treffer
- very large scale integration 1 Treffer
- vlsi design 1 Treffer
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In: IEEE Transactions on Very Large Scale Integration (VLSI) Systems, Jg. 17 (2009-08-01), Heft 8, S. 973-982Online academicJournalZugriff:
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In: IEEE Transactions on Very Large Scale Integration (VLSI) Systems, Jg. 22 (2014-08-01), Heft 8, S. 1777-1777Online academicJournalZugriff: