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Weniger Treffer
Art der Quelle
Thema
- engineered materials, dielectrics and plasmas 104 Treffer
- power, energy and industry applications 79 Treffer
- communication, networking and broadcast technologies 61 Treffer
- degradation 61 Treffer
- computing and processing 54 Treffer
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45 weitere Werte:
- bioengineering 41 Treffer
- silicon 40 Treffer
- aerospace 38 Treffer
- mosfet 38 Treffer
- reliability 33 Treffer
- signal processing and analysis 33 Treffer
- temperature measurement 26 Treffer
- threshold voltage 24 Treffer
- dielectrics 23 Treffer
- robotics and control systems 22 Treffer
- fields, waves and electromagnetics 21 Treffer
- mos devices 21 Treffer
- photonics and electrooptics 20 Treffer
- transistors 18 Treffer
- thin film transistors 17 Treffer
- hemts 15 Treffer
- tddb 15 Treffer
- charge carrier processes 14 Treffer
- electric breakdown 14 Treffer
- mosfets 14 Treffer
- performance evaluation 14 Treffer
- substrates 14 Treffer
- electron traps 13 Treffer
- negative bias temperature instability 13 Treffer
- silicon germanium 13 Treffer
- cmos integrated circuits 12 Treffer
- gallium nitride 12 Treffer
- metals 12 Treffer
- silicon carbide 12 Treffer
- strain 12 Treffer
- stress measurement 12 Treffer
- temperature 11 Treffer
- engineering profession 10 Treffer
- leakage currents 10 Treffer
- nbti 10 Treffer
- switches 10 Treffer
- thermal variables control 10 Treffer
- aluminum gallium nitride 8 Treffer
- current measurement 8 Treffer
- electric fields 8 Treffer
- pbti 8 Treffer
- transportation 8 Treffer
- aging 7 Treffer
- annealing 7 Treffer
- finfets 7 Treffer
Verlag
Publikation
- 2016 ieee international reliability physics symposium (irps), reliability physics symposium (irps), 2016 ieee international 28 Treffer
- ieee electron device letters, electron device letters, ieee, ieee electron device lett. 15 Treffer
- 2013 ieee international integrated reliability workshop final report, integrated reliability workshop final report (irw), 2013 ieee international 13 Treffer
- 2008 symposium on vlsi technology, vlsi technology, 2008 symposium on 9 Treffer
- ieee transactions on electron devices, electron devices, ieee transactions on, ieee trans. electron devices 9 Treffer
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45 weitere Werte:
- 2018 ieee 30th international symposium on power semiconductor devices and ics (ispsd), power semiconductor devices and ics (ispsd), 2018 ieee 30th international symposium on 8 Treffer
- ieee transactions on device and materials reliability, device and materials reliability, ieee transactions on, ieee trans. device mater. relib. 6 Treffer
- 2010 ieee international integrated reliability workshop final report, integrated reliability workshop final report (irw), 2010 ieee international 5 Treffer
- 2010 symposium on vlsi technology, vlsi technology (vlsit), 2010 symposium on 5 Treffer
- 2014 ieee international electron devices meeting, electron devices meeting (iedm), 2014 ieee international 5 Treffer
- symposium 1993 on vlsi technology, vlsi technology, 1993. digest of technical papers. 1993 symposium on 4 Treffer
- 2012 proceedings of the european solid-state device research conference (essderc), solid-state device research conference (essderc), 2012 proceedings of the european 3 Treffer
- 2015 17th european conference on power electronics and applications (epe'15 ecce-europe), power electronics and applications (epe'15 ecce-europe), 2015 17th european conference on 3 Treffer
- 2017 ieee international reliability physics symposium (irps), reliability physics symposium (irps),2017 ieee international 3 Treffer
- 2010 10th ieee international conference on solid-state and integrated circuit technology, solid-state and integrated circuit technology (icsict), 2010 10th ieee international conference on 2 Treffer
- 2010 ieee international conference of electron devices and solid-state circuits (edssc), electron devices and solid-state circuits (edssc), 2010 ieee international conference of 2 Treffer
- 2011 ieee international conference of electron devices and solid-state circuits, electron devices and solid-state circuits (edssc), 2011 international conference of 2 Treffer
- 2011 international conference on quality, reliability, risk, maintenance, and safety engineering, quality, reliability, risk, maintenance, and safety engineering (icqr2mse), 2011 international conference on 2 Treffer
- 2012 8th international caribbean conference on devices, circuits and systems (iccdcs), devices, circuits and systems (iccdcs), 2012 8th international caribbean conference on 2 Treffer
- 2012 symposium on vlsi technology (vlsit), vlsi technology (vlsit), 2012 symposium on 2 Treffer
- 2016 17th international symposium on quality electronic design (isqed), quality electronic design (isqed), 2016 17th international symposium on 2 Treffer
- 2018 4th ieee international conference on emerging electronics (icee), emerging electronics (icee), 2018 4th ieee international conference on 2 Treffer
- 2018 ieee international reliability physics symposium (irps), reliability physics symposium (irps), 2018 ieee international 2 Treffer
- 2019 ieee international reliability physics symposium (irps), reliability physics symposium (irps), 2019 ieee international 2 Treffer
- 2019 international conference on ic design and technology (icicdt), ic design and technology (icicdt), 2019 international conference on 2 Treffer
- ieee transactions on very large scale integration (vlsi) systems, very large scale integration (vlsi) systems, ieee transactions on, ieee trans. vlsi syst. 2 Treffer
- proceedings of the 17th international conference mixed design of integrated circuits and systems - mixdes 2010, mixed design of integrated circuits and systems (mixdes), 2010 proceedings of the 17th international conference 2 Treffer
- proceedings of the ieee 2014 custom integrated circuits conference, custom integrated circuits conference (cicc), 2014 ieee proceedings of the 2 Treffer
- 2008 15th international symposium on the physical and failure analysis of integrated circuits, physical and failure analysis of integrated circuits, 2008. ipfa 2008. 15th international symposium on the 1 Treffer
- 2008 5th international conference on electrical engineering/electronics, computer, telecommunications and information technology, electrical engineering/electronics, computer, telecommunications and information technology, 2008. ecti-con 2008. 5th international conference on 1 Treffer
- 2008 ieee international soi conference, soi conference, 2008. soi. ieee international 1 Treffer
- 2010 17th ieee international conference on electronics, circuits and systems, electronics, circuits, and systems (icecs), 2010 17th ieee international conference on 1 Treffer
- 2010 ieee dallas circuits and systems workshop, circuits and systems workshop (dcas), 2010 ieee dallas 1 Treffer
- 2010 international electron devices meeting, electron devices meeting (iedm), 2010 ieee international 1 Treffer
- 2011 12th intl. conf. on thermal, mechanical & multi-physics simulation and experiments in microelectronics and microsystems, thermal, mechanical and multi-physics simulation and experiments in microelectronics and microsystems (eurosime), 2011 12th international conference on 1 Treffer
- 2011 ieee 23rd international symposium on power semiconductor devices and ics, power semiconductor devices and ics (ispsd), 2011 ieee 23rd international symposium on 1 Treffer
- 2011 second international conference on mechanic automation and control engineering, mechanic automation and control engineering (mace), 2011 second international conference on 1 Treffer
- 2011 symposium on vlsi circuits - digest of technical papers, vlsi circuits (vlsic), 2011 symposium on 1 Treffer
- 2011 symposium on vlsi technology - digest of technical papers, vlsi technology (vlsit), 2011 symposium on 1 Treffer
- 2012 13th international conference on ultimate integration on silicon (ulis), ultimate integration on silicon (ulis), 2012 13th international conference on 1 Treffer
- 2012 17th ieee european test symposium (ets), test symposium (ets), 2012 17th ieee european 1 Treffer
- 2012 19th ieee international symposium on the physical and failure analysis of integrated circuits, physical and failure analysis of integrated circuits (ipfa), 2012 19th ieee international symposium on the 1 Treffer
- 2012 19th international workshop on active-matrix flatpanel displays and devices (am-fpd), active-matrix flatpanel displays and devices (am-fpd), 2012 19th international workshop on 1 Treffer
- 2012 28th international conference on microelectronics proceedings, microelectronics (miel), 2012 28th international conference on 1 Treffer
- 2012 ieee compound semiconductor integrated circuit symposium (csics), compound semiconductor integrated circuit symposium (csics), 2012 ieee 1 Treffer
- 2012 ieee international integrated reliability workshop final report, integrated reliability workshop final report (irw), 2012 ieee international 1 Treffer
- 2012 semi advanced semiconductor manufacturing conference, advanced semiconductor manufacturing conference (asmc), 2012 23rd annual semi 1 Treffer
- 2013 ieee 10th international conference on asic, asic (asicon), 2013 ieee 10th international conference on 1 Treffer
- 2013 ieee international reliability physics symposium (irps), reliability physics symposium (irps), 2013 ieee international 1 Treffer
- 2013 ieee international solid-state circuits conference digest of technical papers, solid-state circuits conference digest of technical papers (isscc), 2013 ieee international 1 Treffer
Inhaltsanbieter
212 Treffer
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In: 2022 17th Conference on Ph.D Research in Microelectronics and Electronics (PRIME), 2022-06-12, S. 21-24Online KonferenzZugriff:
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In: 2020 17th China International Forum on Solid State Lighting & 2020 International Forum on Wide Bandgap Semiconductors China (SSLChina: IFWS), 2020-11-23, S. 238-241Online KonferenzZugriff:
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In: 2018 31st International Conference on VLSI Design and 2018 17th International Conference on Embedded Systems (VLSID), 2018, S. 256-260Online KonferenzZugriff:
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In: 2017 IEEE 17th International Conference on Nanotechnology (IEEE-NANO), 2017-07-01, S. 459-462Online KonferenzZugriff:
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In: 2016 17th International Symposium on Quality Electronic Design (ISQED), 2016-03-01, S. 35-40Online KonferenzZugriff:
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In: 2016 17th International Symposium on Quality Electronic Design (ISQED), 2016-03-01, S. 307-312Online KonferenzZugriff:
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In: 2015 17th European Conference on Power Electronics and Applications (EPE'15 ECCE-Europe), 2015-09-01, S. 1-10Online KonferenzZugriff:
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In: 2015 17th European Conference on Power Electronics and Applications (EPE'15 ECCE-Europe), 2015-09-01, S. 1-9Online KonferenzZugriff:
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In: 2015 17th European Conference on Power Electronics and Applications (EPE'15 ECCE-Europe), 2015-09-01, S. 1-9Online KonferenzZugriff:
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In: 2012 17th IEEE European Test Symposium (ETS), 2012-05-01, S. 1-6Online KonferenzZugriff:
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In: 2010 17th IEEE International Conference on Electronics, Circuits and Systems, 2010-12-01, S. 289-292Online KonferenzZugriff:
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In: Proceedings of the 17th International Conference Mixed Design of Integrated Circuits and Systems - MIXDES 2010, 2010-06-01, S. 269-272Online KonferenzZugriff:
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In: Proceedings of the 17th International Conference Mixed Design of Integrated Circuits and Systems - MIXDES 2010, 2010-06-01, S. 477-481Online KonferenzZugriff:
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In: IEEE Transactions on Device and Materials Reliability, Jg. 24 (2024-06-01), Heft 2, S. 174-183Online academicJournalZugriff:
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In: IEEE Transactions on Electron Devices, Jg. 71 (2024-03-01), Heft 3, S. 1792-1797Online academicJournalZugriff:
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In: IEEE Electron Device Letters, Jg. 44 (2023-10-01), Heft 10, S. 1704-1707Online academicJournalZugriff:
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In: IEEE Electron Device Letters, Jg. 44 (2023-10-01), Heft 10, S. 1700-1703Online academicJournalZugriff:
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In: IEEE Transactions on Electron Devices, Jg. 70 (2023), Heft 1, S. 178-184Online academicJournalZugriff:
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In: 2010 IEEE International Integrated Reliability Workshop Final Report, 2010-10-01, S. 17-21Online KonferenzZugriff:
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In: IEEE Electron Device Letters, Jg. 43 (2022-09-01), Heft 9, S. 1408-1411Online academicJournalZugriff: