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Weniger Treffer
Art der Quelle
Thema
- components, circuits, devices and systems 20 Treffer
- engineered materials, dielectrics and plasmas 19 Treffer
- power, energy and industry applications 9 Treffer
- temperature 9 Treffer
- electric breakdown 7 Treffer
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45 weitere Werte:
- degradation 6 Treffer
- fields, waves and electromagnetics 6 Treffer
- general topics for engineers 6 Treffer
- conductors 4 Treffer
- dielectrics and electrical insulation 4 Treffer
- electrodes 4 Treffer
- circuits 3 Treffer
- diodes 3 Treffer
- micromechanical devices 3 Treffer
- performance evaluation 3 Treffer
- radio frequency 3 Treffer
- robotics and control systems 3 Treffer
- accelerated aging 2 Treffer
- acceleration 2 Treffer
- bioengineering 2 Treffer
- bridge circuits 2 Treffer
- capacitance 2 Treffer
- capacitors 2 Treffer
- character generation 2 Treffer
- computing and processing 2 Treffer
- electrostatic discharge 2 Treffer
- finite element methods 2 Treffer
- flashover 2 Treffer
- frequency 2 Treffer
- geometry 2 Treffer
- leakage current 2 Treffer
- mechanical factors 2 Treffer
- moisture 2 Treffer
- mos capacitors 2 Treffer
- mos devices 2 Treffer
- nuclear engineering 2 Treffer
- packaging 2 Treffer
- porcelain 2 Treffer
- predictive models 2 Treffer
- reliability 2 Treffer
- silicon 2 Treffer
- substrates 2 Treffer
- surface contamination 2 Treffer
- switches 2 Treffer
- tunneling 2 Treffer
- aerospace electronics 1 Treffer
- air gaps 1 Treffer
- application software 1 Treffer
- arresters 1 Treffer
- atmospheric radiation 1 Treffer
Publikation
- [1991] proceedings of the 3rd international conference on properties and applications of dielectric materials, properties and applications of dielectric materials, 1991., proceedings of the 3rd international conference on 2 Treffer
- 2005 ieee international reliability physics symposium, 2005. proceedings. 43rd annual., reliability physics symposium, 2005. proceedings. 43rd annual. 2005 ieee international, reliability physics 2 Treffer
- 2006 25th international conference on microelectronics, microelectronics, 2006 25th international conference on 2 Treffer
- 1996 ieee international conference on systems, man and cybernetics. information intelligence and systems (cat. no.96ch35929), systems, man, and cybernetics, 1996., ieee international conference on, systems, man and cybernetics 1 Treffer
- 1997 ieee international conference on microelectronic test structures proceedings, microelectronic test structures, 1997. icmts 1997. proceedings. ieee international conference on, microelectronic test structures 1 Treffer
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25 weitere Werte:
- 1999 annual report conference on electrical insulation and dielectric phenomena (cat. no.99ch36319), electrical insulation and dielectric phenomena, 1999 annual report conference on, electrical insulation and dielectric phenomena 1 Treffer
- 2000 22nd international conference on microelectronics. proceedings (cat. no.00th8400), microelectronics, 2000. proceedings. 2000 22nd international conference on, microelectronics 1 Treffer
- 2000 international conference on ion implantation technology proceedings. ion implantation technology - 2000 (cat. no.00ex432), ion implantation technology, 2000. conference on, ion implantation technology 1 Treffer
- 2001 annual report conference on electrical insulation and dielectric phenomena (cat. no.01ch37225), electrical insulation and dielectric phenomena, 2001 annual report. conference on, electrical insulation and dielectric phenomena 1 Treffer
- 2003 ieee power engineering society general meeting (ieee cat. no.03ch37491), power engineering society general meeting, 2003, ieee, power engineering society 1 Treffer
- 2005 ieee international integrated reliability workshop, integrated reliability workshop final report, 2005 ieee international, integrated reliability workshop 1 Treffer
- 2006 ieee radiation effects data workshop, radiation effects data workshop, 2006 ieee 1 Treffer
- 2007 annual report - conference on electrical insulation and dielectric phenomena, electrical insulation and dielectric phenomena, 2007. ceidp 2007. annual report - conference on 1 Treffer
- 2007 ieee international conference on microelectronic test structures, microelectronic test structures, 2007. icmts '07. ieee international conference on 1 Treffer
- 2007 international semiconductor conference, semiconductor conference, 2007. cas 2007. international 1 Treffer
- 2008 computers in cardiology, computers in cardiology, 2008 1 Treffer
- 2008 ieee international reliability physics symposium, reliability physics symposium, 2008. irps 2008. ieee international 1 Treffer
- 2008 international conference on electrical machines and systems, electrical machines and systems, 2008. icems 2008. international conference on 1 Treffer
- 2008 rocs workshop [reliability of compound semiconductors workshop], rocs workshop, 2008 [reliability of compound semiconductors workshop] 1 Treffer
- 2010 17th ieee international symposium on the physical and failure analysis of integrated circuits, physical and failure analysis of integrated circuits (ipfa), 2010 17th ieee international symposium on the 1 Treffer
- 20th ieee/npss symposium onfusion engineering, 2003., fusion engineering, 2003. 20th ieee/npss symposium on, fusion engineering 1 Treffer
- 28th annual proceedings on reliability physics symposium, reliability physics symposium, 1990. 28th annual proceedings., international 1 Treffer
- ieee transactions on device and materials reliability, device and materials reliability, ieee transactions on, ieee trans. device mater. relib. 1 Treffer
- ieee transactions on magnetics, magnetics, ieee transactions on, ieee trans. magn. 1 Treffer
- international conference on microelectronic test structures, 2003., microelectronic test structures, 2003. international conference on, microelectronic test structures 1 Treffer
- proceedings isdeiv. 18th international symposium on discharges and electrical insulation in vacuum (cat. no.98ch36073), discharges and electrical insulation in vacuum, 1998. proceedings isdeiv. xviiith international symposium on, discharges and electrical insulation in vacuum 1 Treffer
- proceedings of ieee conference on electrical insulation and dielectric phenomena - (ceidp '93), electrical insulation and dielectric phenomena, 1993. annual report., conference on, electrical insulation and dielectric phenomena 1 Treffer
- proceedings of the 1997 6th international symposium on the physical and failure analysis of integrated circuits, physical & failure analysis of integrated circuits, 1997., proceedings of the 1997 6th international symposium on, physical and failure analysis of integrated circuits 1 Treffer
- proceedings of the 25th annual international conference of the ieee engineering in medicine and biology society (ieee cat. no.03ch37439), engineering in medicine and biology society, 2003. proceedings of the 25th annual international conference of the ieee, engineering in medicine and biology society 1 Treffer
- the 17th annual meeting of the ieee lasers and electro-optics society, 2004. leos 2004., electrical insulation and dielectric phenomena, 2004. ceidp '04. 2004 annual report conference on, electrical insulation and dielectric phenomena 1 Treffer
Inhaltsanbieter
33 Treffer
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In: 2010 17th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits, 2010-07-01, S. 1-5Online KonferenzZugriff:
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In: The 17th Annual Meeting of the IEEE Lasers and Electro-Optics Society, 2004. LEOS 2004., Electrical Insulation and Dielectric Phenomena, 2004, S. 306-309Online KonferenzZugriff:
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In: IEEE Transactions on Device and Materials Reliability, Jg. 6 (2006-09-01), Heft 3, S. 455-460Online academicJournalZugriff:
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In: [1991] Proceedings of the 3rd International Conference on Properties and Applications of Dielectric Materials, 1991, S. 915-919Online KonferenzZugriff:
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In: 2006 IEEE Radiation Effects Data Workshop, 2006-07-01, S. 172Online KonferenzZugriff:
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In: [1991] Proceedings of the 3rd International Conference on Properties and Applications of Dielectric Materials, 1991, S. 1149-1151Online KonferenzZugriff:
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In: 2006 25th International Conference on Microelectronics, 2006, S. 528-531Online KonferenzZugriff:
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In: 2006 25th International Conference on Microelectronics, 2006, S. 532-535Online KonferenzZugriff:
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In: 2005 IEEE International Reliability Physics Symposium, 2005. Proceedings. 43rd, 2005, S. 431-434Online KonferenzZugriff:
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In: Proceedings of the 25th Annual International Conference of the IEEE Engineering in Medicine and Biology Society (IEEE Cat. No.03CH37439), Jg. 3 (2003), S. 2189-2192Online KonferenzZugriff:
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In: International Conference on Microelectronic Test Structures,, 2003, S. 3-44Online KonferenzZugriff:
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In: 20th IEEE/NPSS Symposium onFusion Engineering,, 2003, S. 427-431Online KonferenzZugriff:
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In: 2003 IEEE Power Engineering Society General Meeting (IEEE Cat. No.03CH37491), Jg. 1 (2003), S. 219-224Online KonferenzZugriff:
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In: 2001 Annual Report Conference on Electrical Insulation and Dielectric Phenomena (Cat. No.01CH37225), 2001, S. 392-396Online KonferenzZugriff:
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In: 2000 International Conference on Ion Implantation Technology Proceedings. Ion Implantation Technology - 2000 (Cat. No.00EX432), 2000, S. 565-568Online KonferenzZugriff:
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In: 2000 22nd International Conference on Microelectronics. Proceedings (Cat. No.00TH8400), Jg. 1 (2000), S. 327-330Online KonferenzZugriff:
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In: 1999 Annual Report Conference on Electrical Insulation and Dielectric Phenomena (Cat. No.99CH36319), Jg. 2 (1999), S. 711-714Online KonferenzZugriff:
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In: Proceedings ISDEIV. 18th International Symposium on Discharges and Electrical Insulation in Vacuum (Cat. No.98CH36073), Jg. 2 (1998), S. 679-683Online KonferenzZugriff:
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In: Proceedings of the 1997 6th International Symposium on the Physical and Failure Analysis of Integrated Circuits, 1997, S. 152-155Online KonferenzZugriff:
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In: 1996 IEEE International Conference on Systems, Man and Cybernetics. Information Intelligence and Systems (Cat. No.96CH35929), Jg. 3 (1996), S. 1983-1988Online KonferenzZugriff: