Suchergebnisse
Katalog
Mehr
Suchmaske
Suchergebnisse einschränken oder erweitern
Aktive Suchfilter
Weniger Treffer
Art der Quelle
Thema
- hemts 40 Treffer
- modfets 33 Treffer
- aluminum gallium nitride 27 Treffer
- gan 25 Treffer
- logic gates 23 Treffer
-
45 weitere Werte:
- power generation 14 Treffer
- substrates 14 Treffer
- silicon 12 Treffer
- cutoff frequency 10 Treffer
- algan/gan 8 Treffer
- schottky diodes 8 Treffer
- leakage current 7 Treffer
- temperature measurement 7 Treffer
- leakage currents 6 Treffer
- aln 5 Treffer
- hemt 5 Treffer
- light emitting diodes 5 Treffer
- performance evaluation 5 Treffer
- schottky barriers 5 Treffer
- wide band gap semiconductors 5 Treffer
- current density 4 Treffer
- doping 4 Treffer
- electric breakdown 4 Treffer
- electrons 4 Treffer
- fabrication 4 Treffer
- high-electron-mobility transistor (hemt) 4 Treffer
- metal-insulator structures 4 Treffer
- microwave devices 4 Treffer
- power measurement 4 Treffer
- radio frequency 4 Treffer
- silicon carbide 4 Treffer
- surface treatment 4 Treffer
- thermal conductivity 4 Treffer
- annealing 3 Treffer
- breakdown 3 Treffer
- breakdown voltage 3 Treffer
- capacitance 3 Treffer
- dielectrics 3 Treffer
- metal-insulator-semiconductor (mis) 3 Treffer
- mosfet 3 Treffer
- passivation 3 Treffer
- power amplifiers 3 Treffer
- silicon compounds 3 Treffer
- switches 3 Treffer
- threshold voltage 3 Treffer
- voltage 3 Treffer
- voltage measurement 3 Treffer
- back-barrier 2 Treffer
- cathodes 2 Treffer
- chemical vapor deposition 2 Treffer
Inhaltsanbieter
70 Treffer
-
In: IEEE Electron Device Letters, Jg. 22 (2001-08-01), Heft 8, S. 407-409Online academicJournalZugriff:
-
In: IEEE Electron Device Letters, Jg. 22 (2001-04-01), Heft 4, S. 157-159Online academicJournalZugriff:
-
In: IEEE Electron Device Letters, Jg. 21 (2000-04-01), Heft 4, S. 176-178Online academicJournalZugriff:
-
In: IEEE Electron Device Letters, Jg. 36 (2015-02-01), Heft 2, S. 123-123Online academicJournalZugriff:
-
In: IEEE Electron Device Letters, Jg. 36 (2015), Heft 1, S. 17-17Online academicJournalZugriff:
-
In: IEEE Electron Device Letters, Jg. 18 (1997-06-01), Heft 6, S. 293-295Online academicJournalZugriff:
-
In: IEEE Electron Device Letters, Jg. 17 (1996-09-01), Heft 9, S. 455-457Online academicJournalZugriff:
-
In: IEEE Electron Device Letters, Jg. 17 (1996-07-01), Heft 7, S. 325-327Online academicJournalZugriff:
-
In: IEEE Electron Device Letters, Jg. 35 (2014-07-01), Heft 7, S. 735-735Online academicJournalZugriff:
-
In: IEEE Electron Device Letters, Jg. 17 (1996-12-01), Heft 12, S. 584-585Online academicJournalZugriff: