Impact of High Temperature Up to 175 °C on the DC and RF Performances of 22-nm FD-SOI MOSFETs
In: IEEE Transactions on Electron Devices, Jg. 70 (2023-10-01), Heft 10, S. 4987-4992
Online
academicJournal
Zugriff:
Titel: |
Impact of High Temperature Up to 175 °C on the DC and RF Performances of 22-nm FD-SOI MOSFETs
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Autor/in / Beteiligte Person: | Halder, A. ; Nyssens, L. ; Vanbrabant, M. ; Rack, M. ; Lederer, D. ; Kilchytska, V. ; Raskin, J. |
Link: | |
Zeitschrift: | IEEE Transactions on Electron Devices, Jg. 70 (2023-10-01), Heft 10, S. 4987-4992 |
Veröffentlichung: | 2023 |
Medientyp: | academicJournal |
ISSN: | 0018-9383 (print) ; 1557-9646 (print) |
DOI: | 10.1109/TED.2023.3303150 |
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