Single-Event Effects Response of 96- and 176-Layer 3D NAND Flash Memories
In: IEEE Radiation Effects Data Workshop (REDW) (in conjunction with 2023 NSREC); (2023-07-01) S. 1-6
Online
Konferenz
Zugriff:
Titel: |
Single-Event Effects Response of 96- and 176-Layer 3D NAND Flash Memories
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Autor/in / Beteiligte Person: | Wilcox, Edward P. ; Joplin, Matthew B. ; Berg, Melanie D. |
Link: | |
Quelle: | IEEE Radiation Effects Data Workshop (REDW) (in conjunction with 2023 NSREC); (2023-07-01) S. 1-6 |
Veröffentlichung: | 2023 |
Medientyp: | Konferenz |
ISBN: | 979-8-3503-5820-9 (print) |
ISSN: | 2154-0535 (print) |
DOI: | 10.1109/REDW61050.2023.10265834 |
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