Comprehensive physics-based modeling of post-cycling long-term data retention in 176L 3-D NAND Flash Memories
In: IEEE International Memory Workshop (IMW); (2024-05-12) S. 1-4
Online
Konferenz
Zugriff:
Titel: |
Comprehensive physics-based modeling of post-cycling long-term data retention in 176L 3-D NAND Flash Memories
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Autor/in / Beteiligte Person: | Thakor, Karansingh ; Rangarajan, Nikhil ; Diwakar, Himanshu ; Saikia, Rashmi ; Samadder, Tarun ; Mahapatra, Souvik ; Raghunathan, Shyam ; Dong, Yingda |
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Quelle: | IEEE International Memory Workshop (IMW); (2024-05-12) S. 1-4 |
Veröffentlichung: | 2024 |
Medientyp: | Konferenz |
ISBN: | 979-8-3503-0652-1 (print) |
ISSN: | 2573-7503 (print) |
DOI: | 10.1109/IMW59701.2024.10536955 |
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