On the Exploitation of Narrow-Width Values for Improving Register File Reliability
In: IEEE Transactions on Very Large Scale Integration (VLSI) Systems, Jg. 17 (2009-07-01), Heft 7, S. 953-963
Online
academicJournal
Zugriff:
Titel: |
On the Exploitation of Narrow-Width Values for Improving Register File Reliability
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Autor/in / Beteiligte Person: | Hu, J. ; Wang, S. ; Ziavras, S. G. |
Link: | |
Zeitschrift: | IEEE Transactions on Very Large Scale Integration (VLSI) Systems, Jg. 17 (2009-07-01), Heft 7, S. 953-963 |
Veröffentlichung: | 2009 |
Medientyp: | academicJournal |
ISSN: | 1063-8210 (print) ; 1557-9999 (print) |
DOI: | 10.1109/TVLSI.2009.2017441 |
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