Study of turn-on characteristics of SCRs for ESD protection with TDR-O and TDR-S TLPs
In: 17th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA 2010); (2010-07-01) S. 1-8
Online
Konferenz
Zugriff:
Titel: |
Study of turn-on characteristics of SCRs for ESD protection with TDR-O and TDR-S TLPs
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Autor/in / Beteiligte Person: | Huo, Ming-xu ; Han, Yan ; Li, You ; Song, Bo ; Liou, Juin-jie ; Dong, Shu-rong ; Ding, Kou-bao ; Guo, Wei ; Huang, Dahai ; Li, Mingliang ; Ma, Fei ; Miao, Meng |
Link: | |
Quelle: | 17th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA 2010); (2010-07-01) S. 1-8 |
Veröffentlichung: | 2010 |
Medientyp: | Konferenz |
ISBN: | 978-1-4244-5596-6 (print) ; 978-1-4244-5597-3 (print) ; 978-1-4244-5598-0 (print) |
ISSN: | 1946-1542 (print) ; 1946-1550 (print) |
DOI: | 10.1109/IPFA.2010.5532309 |
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