Accelerating capture of infrequent errors on ATE for silicon TV tuners
In: IEEE 32nd VLSI Test Symposium (VTS); (2014-04-01) S. 1-6
Online
Konferenz
Zugriff:
Titel: |
Accelerating capture of infrequent errors on ATE for silicon TV tuners
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Autor/in / Beteiligte Person: | Fan, Y. ; Verma, A. ; Trager, D. S. ; Poorfard, R. K. ; Janney, J. ; Kumar, S. |
Link: | |
Quelle: | IEEE 32nd VLSI Test Symposium (VTS); (2014-04-01) S. 1-6 |
Veröffentlichung: | 2014 |
Medientyp: | Konferenz |
ISBN: | 978-1-4799-2611-4 (print) |
ISSN: | 1093-0167 (print) ; 2375-1053 (print) |
DOI: | 10.1109/VTS.2014.6818752 |
Sonstiges: |
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