System specific modeling for absolute quantification of 99mTc and 177Lu with SPECT/CT
In: IEEE Nuclear Science Symposium, Medical Imaging Conference and Room-Temperature Semiconductor Detector Workshop (NSS/MIC/RTSD); (2016-10-01) S. 1-3
Online
Konferenz
Zugriff:
Titel: |
System specific modeling for absolute quantification of 99mTc and 177Lu with SPECT/CT
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Autor/in / Beteiligte Person: | Ryu, Hyun ; Ju ; Willowson, Kathy P ; Meikle, Steven R ; Bailey, Dale L |
Link: | |
Quelle: | IEEE Nuclear Science Symposium, Medical Imaging Conference and Room-Temperature Semiconductor Detector Workshop (NSS/MIC/RTSD); (2016-10-01) S. 1-3 |
Veröffentlichung: | 2016 |
Medientyp: | Konferenz |
ISBN: | 978-1-5090-1642-6 (print) |
DOI: | 10.1109/NSSMIC.2016.8069464 |
Sonstiges: |
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