Variation-Aware Delay Fault Testing for Carbon-Nanotube FET Circuits
In: IEEE Transactions on Very Large Scale Integration (VLSI) Systems, Jg. 29 (2021-02-01), Heft 2, S. 409-422
Online
academicJournal
Zugriff:
Titel: |
Variation-Aware Delay Fault Testing for Carbon-Nanotube FET Circuits
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Autor/in / Beteiligte Person: | Banerjee, S. ; Chaudhuri, A. ; Ning, A. ; Chakrabarty, K. |
Link: | |
Zeitschrift: | IEEE Transactions on Very Large Scale Integration (VLSI) Systems, Jg. 29 (2021-02-01), Heft 2, S. 409-422 |
Veröffentlichung: | 2021 |
Medientyp: | academicJournal |
ISSN: | 1063-8210 (print) ; 1557-9999 (print) |
DOI: | 10.1109/TVLSI.2020.3045417 |
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